Instrumental-analysis-techniques-to-study-surfaces-and-surface-modifications (2018)


ECTS credits:

0,5 ECTS

 

Course parameters:

Language: English

Level of course: PhD course

Time of year: 24 April 2018

No. of contact hours/hours in total incl. preparation, assignment(s) or the like: 5/15

Capacity limits: 50

 

Objectives of the course:

The objective of this course is to introduce to students basic principles of several modern surface analysis techniques.

 

Learning outcomes and competences:

At the end of the course, the student should be able to:

  • Understand basic aspects of some electrochemical experiments
  • Understand the basics of scanning probe microscopies and their applications to the study of surfaces
  • Understand basic X-ray photoelectron spectroscopy principles and interpete simple spectra
  • Understand basic principles of secondary ion mass spectrometry
  • Understand general principles of surface analysis

 

Compulsory programme:

Active participation

 

Course contents:

An interactive lecture with 5 different components, inducing basic principles of the following aspects of surface analysis:

a. A brief introduction into electrochemistry

b. Scanning probe microscopies

c. Electron microscopies

d. Secondary ion mass spectrometry

e. X-ray photoelectron spectroscopy

 

Prerequisites:

None

 

Name of lecturer:

Professor Bernie Kraatz, University of Toronto, Canada

 

Type of course/teaching methods:

Lectures

 

Literature:

1) A brief introduction into electrochemistry

Kissinger & Heineman, J. Chem. Ed. 198360, 702.

Ding et al., Anal. Chim. Acta 2005554, 43.

 

2) Scanning probe microscopies

G. Binnig et al., Phys. Rev. Lett. 198249, 57

G. Binnig et al., Phys. Rev. Lett. 198656, 930

 

3) Electron microscopies

Knoll et al., Z.Physik 193276, 649.

M. v. Ardenne, Z. Tech. Physik 193819, 407.

 

4) Secondary ion mass spectrometry

D.S. McPhail, J. Mater. Sci. 200641, 873.

S. Ninomiya et al., Rapid Commun. Mass Spectrom. 200923, 1601.

 

5) X-ray photoelectron spectroscopy

C.S. Fadley, J. Electron Spectrosc. Relat. Phenom. 2010178-179, 2.


Course homepage:

http://events.au.dk/SurfaceCharacterisation



Course assessment:

Pass/fail based on participation

 


Provider:

iNANO, Aarhus University

 

Time:

24 April 2018

 

Place:

iNANO Auditorium, Gustav Wieds Vej 14

 

Registration:

Deadline for registration is 23 April 2018.

For registration: http://events.au.dk/SurfaceCharacterisation

If you have any questions, please contact Course organizer Elena Ferapontova, e-mail: elena.ferapontova@inano.au.dk or PhD administrator Maria Kragelund, e-mail: maria@inano.au.dk