Qualifying exam: Electrically Active Defects in Epitaxial GaN

PhD student Ievgen Boturchuk, iNano

2017.02.06 | Steffi Hjerrild Iversen

Date Tue 21 Feb
Time 13:15 15:15
Location Building 1593, Room 226, iNANO House, Gustav Wieds Vej 14, Aarhus University, 8000 Aarhus C

Examiners:

External examiner: PhD Erik Vilain Thomsen, Department of Micro- and Nanotechnology, Technical University of Denmark (DTU)

Internal examiner: Associate Professor Jeppe V. Lauritsen, iNano, Aarhus University

Examiner / Main supervisor: Associate Professor Brian Julsgaard, iNano and Department of Physics and Astronomy, Aarhus University

Talent development
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Revised 13.10.2017